Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups


Applications and functions

  • Fast and reliable photocurrent mapping with highest resolution
  • In-depth defect detection, visualization and identification  – shunts, coating defects, localize inactive regions
  • Study degradation effects
  • Quality control tool
  • A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
  • Electrical excitation for electroluminescence measurements
  • Different (multiple) laser wavelengths available
  • Up to 300×300 mm² scanning area
  • Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE, …


  • Different laser choices
  • Laser check for beam circularity
  • Versatile sample holder
  • Easy to use control software with data export
  • Different detector options for luminescence measurements, optimized to application and budget

See also

PL/EL Options

Art. No.Description
PLPL Upgrade – high quality detector system optimized for each application from 200-1700 nm
ELEL Upgrade (PL option required)
FCFiber bundle connector for using the detector system with other inputs

LBIC Options

Art. No.Description
LBICLBIC system with optical isolator for laser protection
X-Lyyy-zz mWLaser No. X with wavelength yyy nm and zz mW maximum power (laser No. 1 is main laser – up to 3 lasers possible)
LCLaser check for beam circularity
HRHigh resolution option – 10x magnification objective
PMPower meter for measuring and observing the laser intensity during measurement
MPMultiplexer for automatic measurements of substrates with more than 1 contact – 8 channels standard
ECEnvironmental chamber to keep the sample in nitrogen atmosphere during measurement. Maximum sample size 50×50 mm²
ECQGEnvironmental chamber with quartz glass window (recommended for PL/EL)
SA5050×50 mm² scan area
SA100100×100 mm² scan area
SA150150×150 mm² scan area
SA300300×300 mm² scan area